Age | Commit message (Collapse) | Author |
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Add a simplified path evaluation function IMFS_eval_path_devfs() for a
device only IMFS configuration.
The code size can be further reduced by the application if it disables
the support for legacy IO drivers via:
#define CONFIGURE_IMFS_DISABLE_MKNOD
#define CONFIGURE_IMFS_DISABLE_MKNOD_DEVICE
Obsolete CONFIGURE_MAXIMUM_DEVICES. Remove BSP_MAXIMUM_DEVICES.
Update #3894.
Update #3898.
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Rename CONFIGURE_LIBIO_MAXIMUM_FILE_DESCRIPTORS into
CONFIGURE_MAXIMUM_FILE_DESCRIPTORS.
Update #3753.
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This configuration is superfluous in these tests.
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Update #3170.
Update #3199.
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The TEST_EXTERN is a used only by the system.h style tests and they use
CONFIGURE_INIT appropriately.
Update #3170.
Update #3199.
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- Remove the printf support leaving the direct printk support configured
with TESTS_USE_PRINTK and all other output goes via a buffered vsniprintf
call to printk.
- Control the test's single init for functions and global data with
TEST_INIT and not CONFIGURE_INIT. They are now separate.
Updates #3170.
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This define was superfluous, undocumented and used inconsistently.
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Script does what is expected and tries to do it as
smartly as possible.
+ remove occurrences of two blank comment lines
next to each other after Id string line removed.
+ remove entire comment blocks which only exited to
contain CVS Ids
+ If the processing left a blank line at the top of
a file, it was removed.
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PR 1654/testing
* deviceio01/init.c, deviceio01/deviceio01.doc,
deviceio01/deviceio01.scn, deviceio01/test_driver.c,
deviceio01/test_driver.h, deviceio01/Makefile.am: New test added.
* Makefile.am, configure.ac: Changes to added above test.
* tar02/init.c, tar02/tar02.scn: New test case added: IMFS_dump().
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