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authorSebastian Huber <sebastian.huber@embedded-brains.de>2018-04-22 15:38:55 +0200
committerSebastian Huber <sebastian.huber@embedded-brains.de>2018-04-23 15:18:43 +0200
commita62c75c1e384c2388e4c193d661183f5ac48a764 (patch)
tree20d1ff2373d52a41249eaebe8b394b5a19170a81 /c/src/lib/libbsp/arm/tms570/hwinit/tms570_tcram_tests.c
parentbsp/gen5200: Move bestcomm to bsps (diff)
downloadrtems-a62c75c1e384c2388e4c193d661183f5ac48a764.tar.bz2
bsp/tms570: Move more start to bsps
This patch is a part of the BSP source reorganization. Update #3285.
Diffstat (limited to 'c/src/lib/libbsp/arm/tms570/hwinit/tms570_tcram_tests.c')
-rw-r--r--c/src/lib/libbsp/arm/tms570/hwinit/tms570_tcram_tests.c185
1 files changed, 0 insertions, 185 deletions
diff --git a/c/src/lib/libbsp/arm/tms570/hwinit/tms570_tcram_tests.c b/c/src/lib/libbsp/arm/tms570/hwinit/tms570_tcram_tests.c
deleted file mode 100644
index d0c7bbfff5..0000000000
--- a/c/src/lib/libbsp/arm/tms570/hwinit/tms570_tcram_tests.c
+++ /dev/null
@@ -1,185 +0,0 @@
-/**
- * @file tms570_tcram_tests.c
- *
- * @ingroup tms570
- *
- * @brief TCRAM selftest function.
- */
-/*
- * Copyright (c) 2016 Pavel Pisa <pisa@cmp.felk.cvut.cz>
- *
- * Czech Technical University in Prague
- * Zikova 1903/4
- * 166 36 Praha 6
- * Czech Republic
- *
- * The license and distribution terms for this file may be
- * found in the file LICENSE in this distribution or at
- * http://www.rtems.org/license/LICENSE.
- *
- * Algorithms are based on Ti manuals and Ti HalCoGen generated
- * code available under following copyright.
- */
-/*
- * Copyright (C) 2009-2015 Texas Instruments Incorporated - www.ti.com
- *
- *
- * Redistribution and use in source and binary forms, with or without
- * modification, are permitted provided that the following conditions
- * are met:
- *
- * Redistributions of source code must retain the above copyright
- * notice, this list of conditions and the following disclaimer.
- *
- * Redistributions in binary form must reproduce the above copyright
- * notice, this list of conditions and the following disclaimer in the
- * documentation and/or other materials provided with the
- * distribution.
- *
- * Neither the name of Texas Instruments Incorporated nor the names of
- * its contributors may be used to endorse or promote products derived
- * from this software without specific prior written permission.
- *
- * THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND CONTRIBUTORS
- * "AS IS" AND ANY EXPRESS OR IMPLIED WARRANTIES, INCLUDING, BUT NOT
- * LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR
- * A PARTICULAR PURPOSE ARE DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT
- * OWNER OR CONTRIBUTORS BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL,
- * SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT
- * LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE,
- * DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY
- * THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT
- * (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE USE
- * OF THIS SOFTWARE, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.
- *
- */
-
-#include <stdint.h>
-#include <bsp/tms570.h>
-#include "tms570_selftest.h"
-#include "tms570_hwinit.h"
-
-#define tcramA1bitError (*(volatile uint32_t *)(0x08400000U))
-#define tcramA2bitError (*(volatile uint32_t *)(0x08400010U))
-
-#define tcramB1bitError (*(volatile uint32_t *)(0x08400008U))
-#define tcramB2bitError (*(volatile uint32_t *)(0x08400018U))
-
-#define tcramA1bit (*(volatile uint64_t *)(0x08000000U))
-#define tcramA2bit (*(volatile uint64_t *)(0x08000010U))
-
-#define tcramB1bit (*(volatile uint64_t *)(0x08000008U))
-#define tcramB2bit (*(volatile uint64_t *)(0x08000018U))
-
-/**
- * @brief Check TCRAM ECC error detection logic (HCG:checkRAMECC)
- *
- * This function checks TCRAM ECC error detection and correction logic.
- * The function does not return in case of TCRAM error.
- * It calls bsp_selftest_fail_notification() instead.
- *
- */
-/* SourceId : SELFTEST_SourceId_034 */
-/* DesignId : SELFTEST_DesignId_019 */
-/* Requirements : HL_SR408 */
-void tms570_check_tcram_ecc( void )
-{
- volatile uint64_t ramread;
- volatile uint32_t regread;
- uint32_t tcram1ErrStat, tcram2ErrStat = 0U;
-
- uint64_t tcramA1_bk = tcramA1bit;
- uint64_t tcramB1_bk = tcramB1bit;
- uint64_t tcramA2_bk = tcramA2bit;
- uint64_t tcramB2_bk = tcramB2bit;
-
- /* Clear RAMOCUUR before setting RAMTHRESHOLD register */
- TMS570_TCRAM1.RAMOCCUR = 0U;
- TMS570_TCRAM2.RAMOCCUR = 0U;
-
- /* Set Single-bit Error Threshold Count as 1 */
- TMS570_TCRAM1.RAMTHRESHOLD = 1U;
- TMS570_TCRAM2.RAMTHRESHOLD = 1U;
-
- /* Enable single bit error generation */
- TMS570_TCRAM1.RAMINTCTRL = 1U;
- TMS570_TCRAM2.RAMINTCTRL = 1U;
-
- /* Enable writes to ECC RAM, enable ECC error response */
- TMS570_TCRAM1.RAMCTRL = 0x0005010AU;
- TMS570_TCRAM2.RAMCTRL = 0x0005010AU;
-
- /* Force a single bit error in both the banks */
- _coreDisableRamEcc_();
- tcramA1bitError ^= 1U;
- tcramB1bitError ^= 1U;
- _coreEnableRamEcc_();
-
- /* Read the corrupted data to generate single bit error */
- ramread = tcramA1bit;
- ramread = tcramB1bit;
- (void)ramread;
-
- /* Check for error status */
- tcram1ErrStat = TMS570_TCRAM1.RAMERRSTATUS & 0x1U;
- tcram2ErrStat = TMS570_TCRAM2.RAMERRSTATUS & 0x1U;
- /*SAFETYMCUSW 139 S MR:13.7 <APPROVED> "LDRA Tool issue" */
- /*SAFETYMCUSW 139 S MR:13.7 <APPROVED> "LDRA Tool issue" */
- if ((tcram1ErrStat == 0U) || (tcram2ErrStat == 0U)) {
- /* TCRAM module does not reflect 1-bit error reported by CPU */
- bsp_selftest_fail_notification(CHECKRAMECC_FAIL1);
- } else {
- if (!tms570_esm_channel_sr_get(1, 26) || !tms570_esm_channel_sr_get(1, 28)) {
- /* TCRAM 1-bit error not flagged in ESM */
- bsp_selftest_fail_notification(CHECKRAMECC_FAIL2);
- } else {
- /* Clear single bit error flag in TCRAM module */
- TMS570_TCRAM1.RAMERRSTATUS = 0x1U;
- TMS570_TCRAM2.RAMERRSTATUS = 0x1U;
-
- /* Clear ESM status */
- tms570_esm_channel_sr_clear(1, 26);
- tms570_esm_channel_sr_clear(1, 28);
- }
- }
-
-#if 0
- /*
- * This test sequence requires that data abort exception
- * handler checks for ECC test write enable in RAMCTR (bit 8)
- * and if the access abort is intended then it should clear
- * error status TCRAM status register and checks and clears
- * ESM group3 uncorrectable TCRAM error channels.
- *
- * More modifications in BSP and RTEMS ARM support are
- * required to make this code work.
- */
-
- /* Force a double bit error in both the banks */
- _coreDisableRamEcc_();
- tcramA2bitError ^= 3U;
- tcramB2bitError ^= 3U;
- _coreEnableRamEcc_();
-
- /* Read the corrupted data to generate double bit error */
- ramread = tcramA2bit;
- ramread = tcramB2bit;
- /* read from location with 2-bit ECC error this will cause a data abort to be generated */
- /* See HalCoGen support src/sys/asm/dabort.asm */
- /* _ARMV4_Exception_data_abort_default has to include solution for this special case for RTEMS */
-#endif
-
- regread = TMS570_TCRAM1.RAMUERRADDR;
- regread = TMS570_TCRAM2.RAMUERRADDR;
- (void)regread;
-
- /* disable writes to ECC RAM */
- TMS570_TCRAM1.RAMCTRL = 0x0005000AU;
- TMS570_TCRAM2.RAMCTRL = 0x0005000AU;
-
- /* Compute correct ECC */
- tcramA1bit = tcramA1_bk;
- tcramB1bit = tcramB1_bk;
- tcramA2bit = tcramA2_bk;
- tcramB2bit = tcramB2_bk;
-}