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| author | Sebastian Huber <sebastian.huber@embedded-brains.de> | 2018-03-21 07:15:22 +0100 |
|---|---|---|
| committer | Sebastian Huber <sebastian.huber@embedded-brains.de> | 2018-03-21 07:43:32 +0100 |
| commit | 26623e37fd9051ef17c029fb115988c9959c814c (patch) | |
| tree | 843e7e9d7144c4977083af6ec430094d2bab7a61 /bsps/arm/lpc176x | |
| parent | MAINAINERS: Add rule for BSP-specific patches (diff) | |
| download | rtems-26623e37fd9051ef17c029fb115988c9959c814c.tar.bz2 | |
bsp/lpc176x: Remove blunt OPERATION_COUNT define
BSP-specific test customization needs a more sophisticated approach.
Close #3352.
Diffstat (limited to 'bsps/arm/lpc176x')
| -rw-r--r-- | bsps/arm/lpc176x/include/bsp.h | 3 |
1 files changed, 0 insertions, 3 deletions
diff --git a/bsps/arm/lpc176x/include/bsp.h b/bsps/arm/lpc176x/include/bsp.h index e81e1cd53c..14c55f4194 100644 --- a/bsps/arm/lpc176x/include/bsp.h +++ b/bsps/arm/lpc176x/include/bsp.h @@ -38,9 +38,6 @@ #include <rtems.h> #include <bsp/default-initial-extension.h> -/** Define operation count for Tests */ -#define OPERATION_COUNT 4 - #ifdef __cplusplus extern "C" { #endif /* __cplusplus */ |