2007-03-10 Joel Sherrill <joel@OARcorp.com>

	PR 1227/bsps
	* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
	MAX_SHORT_TEST_DURATION. They are obsolete and unused.

24 files changed, 72 insertions, 133 deletions

diff --git a/c/src/lib/libbsp/bare/ChangeLog b/c/src/lib/libbsp/bare/ChangeLog
index 4bf04b1abe..0a958ef74a 100644
--- a/c/src/lib/libbsp/bare/ChangeLog
+++ b/c/src/lib/libbsp/bare/ChangeLog
@@ -1,3 +1,9 @@
+2007-03-10	Joel Sherrill <joel@OARcorp.com>
+
+	PR 1227/bsps
+	* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
+	MAX_SHORT_TEST_DURATION. They are obsolete and unused.
+
 2007-01-26	Ralf Corsépius <ralf.corsepius@rtems.org>
 
 	* Makefile.am: Use MKDIR_P instead of mkdir_p.
diff --git a/c/src/lib/libbsp/bare/include/bsp.h b/c/src/lib/libbsp/bare/include/bsp.h
index 8f745ea0cf..004a200b44 100644
--- a/c/src/lib/libbsp/bare/include/bsp.h
+++ b/c/src/lib/libbsp/bare/include/bsp.h
@@ -37,17 +37,6 @@ extern "C" {
 #define CONFIGURE_INTERRUPT_STACK_MEMORY  (12 * 1024)
 
 /*
- *  Define the time limits for RTEMS Test Suite test durations.
- *  Long test and short test duration limits are provided.  These
- *  values are in seconds and need to be converted to ticks for the
- *  application.
- *
- */
-
-#define MAX_LONG_TEST_DURATION       300 /* 5 minutes = 300 seconds */
-#define MAX_SHORT_TEST_DURATION      3   /* 3 seconds */
-
-/*
  *  Simple spin delay in microsecond units for device drivers.
  *  This is very dependent on the clock speed of the target.
  */
diff --git a/c/src/lib/libbsp/m68k/av5282/ChangeLog b/c/src/lib/libbsp/m68k/av5282/ChangeLog
index 29e87cf9d4..aaf1b4a509 100644
--- a/c/src/lib/libbsp/m68k/av5282/ChangeLog
+++ b/c/src/lib/libbsp/m68k/av5282/ChangeLog
@@ -1,3 +1,9 @@
+2007-03-10	Joel Sherrill <joel@OARcorp.com>
+
+	PR 1227/bsps
+	* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
+	MAX_SHORT_TEST_DURATION. They are obsolete and unused.
+
 2006-12-15	Ralf Corsépius <ralf.corsepius@rtems.org>
 
 	* network/network.c: Use ioctl_command_t as arg in ioctl-functions.
diff --git a/c/src/lib/libbsp/m68k/av5282/include/bsp.h b/c/src/lib/libbsp/m68k/av5282/include/bsp.h
index 6dbd471f3d..3a4705f2b6 100644
--- a/c/src/lib/libbsp/m68k/av5282/include/bsp.h
+++ b/c/src/lib/libbsp/m68k/av5282/include/bsp.h
@@ -33,17 +33,6 @@ extern int rtems_fec_driver_attach (struct rtems_bsdnet_ifconfig *config, int at
 /* define which port the console should use - all other ports are then defined as general purpose */
 #define CONSOLE_PORT        0
 
-
-/*
- *  Define the time limits for RTEMS Test Suite test durations.
- *  Long test and short test duration limits are provided.  These
- *  values are in seconds and need to be converted to ticks for the
- *  application.
- *
- */
-#define MAX_LONG_TEST_DURATION       300 /* 5 minutes = 300 seconds */
-#define MAX_SHORT_TEST_DURATION      3   /* 3 seconds */
-
 /* externals */
 
 /* constants */
diff --git a/c/src/lib/libbsp/m68k/csb360/ChangeLog b/c/src/lib/libbsp/m68k/csb360/ChangeLog
index 1056700af5..a18574464d 100644
--- a/c/src/lib/libbsp/m68k/csb360/ChangeLog
+++ b/c/src/lib/libbsp/m68k/csb360/ChangeLog
@@ -1,3 +1,9 @@
+2007-03-10	Joel Sherrill <joel@OARcorp.com>
+
+	PR 1227/bsps
+	* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
+	MAX_SHORT_TEST_DURATION. They are obsolete and unused.
+
 2006-12-02	Ralf Corsépius <ralf.corsepius@rtems.org>
 
 	* configure.ac: New BUG-REPORT address.
diff --git a/c/src/lib/libbsp/m68k/csb360/include/bsp.h b/c/src/lib/libbsp/m68k/csb360/include/bsp.h
index aa5bce3378..df85017e1a 100644
--- a/c/src/lib/libbsp/m68k/csb360/include/bsp.h
+++ b/c/src/lib/libbsp/m68k/csb360/include/bsp.h
@@ -131,17 +131,6 @@ extern int rtems_enet_driver_attach (struct rtems_bsdnet_ifconfig *config);
 #define BSP_SYSTEM_FREQUENCY (66 * 1000 * 1000)
 
 /*
- *  Define the time limits for RTEMS Test Suite test durations.
- *  Long test and short test duration limits are provided.  These
- *  values are in seconds and need to be converted to ticks for the
- *  application.
- *
- */
-
-#define MAX_LONG_TEST_DURATION       300 /* 5 minutes = 300 seconds */
-#define MAX_SHORT_TEST_DURATION      3   /* 3 seconds */
-
-/*
  *  Simple spin delay in microsecond units for device drivers.
  *  This is very dependent on the clock speed of the target.
  */
diff --git a/c/src/lib/libbsp/m68k/mcf5235/ChangeLog b/c/src/lib/libbsp/m68k/mcf5235/ChangeLog
index 1cbffdb055..3779e3d6d9 100644
--- a/c/src/lib/libbsp/m68k/mcf5235/ChangeLog
+++ b/c/src/lib/libbsp/m68k/mcf5235/ChangeLog
@@ -1,3 +1,9 @@
+2007-03-10	Joel Sherrill <joel@OARcorp.com>
+
+	PR 1227/bsps
+	* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
+	MAX_SHORT_TEST_DURATION. They are obsolete and unused.
+
 2006-12-15	Ralf Corsépius <ralf.corsepius@rtems.org>
 
 	* network/network.c: Use ioctl_command_t as arg in ioctl-functions.
diff --git a/c/src/lib/libbsp/m68k/mcf5235/include/bsp.h b/c/src/lib/libbsp/m68k/mcf5235/include/bsp.h
index ccdd7d486c..d5015692bb 100644
--- a/c/src/lib/libbsp/m68k/mcf5235/include/bsp.h
+++ b/c/src/lib/libbsp/m68k/mcf5235/include/bsp.h
@@ -33,17 +33,6 @@ extern int rtems_fec_driver_attach (struct rtems_bsdnet_ifconfig *config, int at
 /* define which port the console should use - all other ports are then defined as general purpose */
 #define CONSOLE_PORT        0
 
-
-/*
- *  Define the time limits for RTEMS Test Suite test durations.
- *  Long test and short test duration limits are provided.  These
- *  values are in seconds and need to be converted to ticks for the
- *  application.
- *
- */
-#define MAX_LONG_TEST_DURATION       300 /* 5 minutes = 300 seconds */
-#define MAX_SHORT_TEST_DURATION      3   /* 3 seconds */
-
 /* externals */
 
 /* constants */
diff --git a/c/src/lib/libbsp/m68k/uC5282/ChangeLog b/c/src/lib/libbsp/m68k/uC5282/ChangeLog
index 321d9aecbe..d5a32207d1 100644
--- a/c/src/lib/libbsp/m68k/uC5282/ChangeLog
+++ b/c/src/lib/libbsp/m68k/uC5282/ChangeLog
@@ -1,3 +1,9 @@
+2007-03-10	Joel Sherrill <joel@OARcorp.com>
+
+	PR 1227/bsps
+	* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
+	MAX_SHORT_TEST_DURATION. They are obsolete and unused.
+
 2006-12-14	Till Straumann <strauman@slac.stanford.edu>
 
 	* startup/bspstart.c: Changed BSP_installVME_isr() so that
diff --git a/c/src/lib/libbsp/m68k/uC5282/include/bsp.h b/c/src/lib/libbsp/m68k/uC5282/include/bsp.h
index 00677918bd..702917042b 100644
--- a/c/src/lib/libbsp/m68k/uC5282/include/bsp.h
+++ b/c/src/lib/libbsp/m68k/uC5282/include/bsp.h
@@ -50,17 +50,6 @@ extern int rtems_fec_driver_attach (struct rtems_bsdnet_ifconfig *config, int at
 /* define which port the console should use - all other ports are then defined as general purpose */
 #define CONSOLE_PORT        0
 
-
-/*
- *  Define the time limits for RTEMS Test Suite test durations.
- *  Long test and short test duration limits are provided.  These
- *  values are in seconds and need to be converted to ticks for the
- *  application.
- *
- */
-#define MAX_LONG_TEST_DURATION       300 /* 5 minutes = 300 seconds */
-#define MAX_SHORT_TEST_DURATION      3   /* 3 seconds */
-
 /* externals */
 
 /* constants */
diff --git a/c/src/lib/libbsp/mips/csb350/ChangeLog b/c/src/lib/libbsp/mips/csb350/ChangeLog
index ad2c258fbb..aeef325185 100644
--- a/c/src/lib/libbsp/mips/csb350/ChangeLog
+++ b/c/src/lib/libbsp/mips/csb350/ChangeLog
@@ -1,3 +1,9 @@
+2007-03-10	Joel Sherrill <joel@OARcorp.com>
+
+	PR 1227/bsps
+	* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
+	MAX_SHORT_TEST_DURATION. They are obsolete and unused.
+
 2006-12-02	Ralf Corsépius <ralf.corsepius@rtems.org>
 
 	* configure.ac: New BUG-REPORT address.
diff --git a/c/src/lib/libbsp/mips/csb350/include/bsp.h b/c/src/lib/libbsp/mips/csb350/include/bsp.h
index 7f5bfc317c..1dafc579ef 100644
--- a/c/src/lib/libbsp/mips/csb350/include/bsp.h
+++ b/c/src/lib/libbsp/mips/csb350/include/bsp.h
@@ -29,17 +29,6 @@ extern "C" {
 #include <libcpu/au1x00.h>
 
 /*
- *  Define the time limits for RTEMS Test Suite test durations.
- *  Long test and short test duration limits are provided.  These
- *  values are in seconds and need to be converted to ticks for the
- *  application.
- *
- */
-
-#define MAX_LONG_TEST_DURATION       300 /* 5 minutes = 300 seconds */
-#define MAX_SHORT_TEST_DURATION      3   /* 3 seconds */
-
-/*
  *  Define the interrupt mechanism for Time Test 27
  */
 int assert_sw_irw(uint32_t irqnum);
diff --git a/c/src/lib/libbsp/mips/hurricane/ChangeLog b/c/src/lib/libbsp/mips/hurricane/ChangeLog
index e810538b26..a03db142e2 100644
--- a/c/src/lib/libbsp/mips/hurricane/ChangeLog
+++ b/c/src/lib/libbsp/mips/hurricane/ChangeLog
@@ -1,3 +1,9 @@
+2007-03-10	Joel Sherrill <joel@OARcorp.com>
+
+	PR 1227/bsps
+	* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
+	MAX_SHORT_TEST_DURATION. They are obsolete and unused.
+
 2006-12-12	Ralf Corsépius <ralf.corsepius@rtems.org>
 
 	* include/bsp.h: Use uint32_t instead of unsigned32.
diff --git a/c/src/lib/libbsp/mips/hurricane/include/bsp.h b/c/src/lib/libbsp/mips/hurricane/include/bsp.h
index aab4d7d7ea..0dbe88ba79 100644
--- a/c/src/lib/libbsp/mips/hurricane/include/bsp.h
+++ b/c/src/lib/libbsp/mips/hurricane/include/bsp.h
@@ -41,17 +41,6 @@ extern "C" {
 extern void WriteDisplay( char * string );
 
 /*
- *  Define the time limits for RTEMS Test Suite test durations.
- *  Long test and short test duration limits are provided.  These
- *  values are in seconds and need to be converted to ticks for the
- *  application.
- *
- */
-
-#define MAX_LONG_TEST_DURATION       300 /* 5 minutes = 300 seconds */
-#define MAX_SHORT_TEST_DURATION      3   /* 3 seconds */
-
-/*
  *  Stuff for Time Test 27
  */
 
diff --git a/c/src/lib/libbsp/mips/rbtx4925/ChangeLog b/c/src/lib/libbsp/mips/rbtx4925/ChangeLog
index 8037eb1e90..09f3e4ba4c 100644
--- a/c/src/lib/libbsp/mips/rbtx4925/ChangeLog
+++ b/c/src/lib/libbsp/mips/rbtx4925/ChangeLog
@@ -1,3 +1,9 @@
+2007-03-10	Joel Sherrill <joel@OARcorp.com>
+
+	PR 1227/bsps
+	* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
+	MAX_SHORT_TEST_DURATION. They are obsolete and unused.
+
 2006-12-02	Ralf Corsépius <ralf.corsepius@rtems.org>
 
 	* configure.ac: New BUG-REPORT address.
diff --git a/c/src/lib/libbsp/mips/rbtx4925/include/bsp.h b/c/src/lib/libbsp/mips/rbtx4925/include/bsp.h
index 2edd0b6932..c08d390401 100644
--- a/c/src/lib/libbsp/mips/rbtx4925/include/bsp.h
+++ b/c/src/lib/libbsp/mips/rbtx4925/include/bsp.h
@@ -28,17 +28,6 @@ extern "C" {
 #include <libcpu/tx4925.h>
 
 /*
- *  Define the time limits for RTEMS Test Suite test durations.
- *  Long test and short test duration limits are provided.  These
- *  values are in seconds and need to be converted to ticks for the
- *  application.
- *
- */
-
-#define MAX_LONG_TEST_DURATION       300 /* 5 minutes = 300 seconds */
-#define MAX_SHORT_TEST_DURATION      3   /* 3 seconds */
-
-/*
  *  Define the interrupt mechanism for Time Test 27
  *
  *  NOTE: Following are for XXX and are board independent
diff --git a/c/src/lib/libbsp/mips/rbtx4938/ChangeLog b/c/src/lib/libbsp/mips/rbtx4938/ChangeLog
index 3334c9f715..4eed90fd02 100644
--- a/c/src/lib/libbsp/mips/rbtx4938/ChangeLog
+++ b/c/src/lib/libbsp/mips/rbtx4938/ChangeLog
@@ -1,3 +1,9 @@
+2007-03-10	Joel Sherrill <joel@OARcorp.com>
+
+	PR 1227/bsps
+	* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
+	MAX_SHORT_TEST_DURATION. They are obsolete and unused.
+
 2006-12-02	Ralf Corsépius <ralf.corsepius@rtems.org>
 
 	* configure.ac: New BUG-REPORT address.
diff --git a/c/src/lib/libbsp/mips/rbtx4938/include/bsp.h b/c/src/lib/libbsp/mips/rbtx4938/include/bsp.h
index b047dc416c..99158a9443 100644
--- a/c/src/lib/libbsp/mips/rbtx4938/include/bsp.h
+++ b/c/src/lib/libbsp/mips/rbtx4938/include/bsp.h
@@ -28,17 +28,6 @@ extern "C" {
 #include <libcpu/tx4938.h>
 
 /*
- *  Define the time limits for RTEMS Test Suite test durations.
- *  Long test and short test duration limits are provided.  These
- *  values are in seconds and need to be converted to ticks for the
- *  application.
- *
- */
-
-#define MAX_LONG_TEST_DURATION       300 /* 5 minutes = 300 seconds */
-#define MAX_SHORT_TEST_DURATION      3   /* 3 seconds */
-
-/*
  *  Define the interrupt mechanism for Time Test 27
  *
  *  NOTE: Following are for XXX and are board independent
diff --git a/c/src/lib/libbsp/powerpc/gen5200/ChangeLog b/c/src/lib/libbsp/powerpc/gen5200/ChangeLog
index a3dd966a08..8b7c590baa 100644
--- a/c/src/lib/libbsp/powerpc/gen5200/ChangeLog
+++ b/c/src/lib/libbsp/powerpc/gen5200/ChangeLog
@@ -1,3 +1,9 @@
+2007-03-10	Joel Sherrill <joel@OARcorp.com>
+
+	PR 1227/bsps
+	* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
+	MAX_SHORT_TEST_DURATION. They are obsolete and unused.
+
 2007-01-23      Thomas Doerfler <Thomas.Doerfler@embedded-brains.de>
 
 	* console/console.c: corrected typo in UART error handler (usage
diff --git a/c/src/lib/libbsp/powerpc/gen5200/include/bsp.h b/c/src/lib/libbsp/powerpc/gen5200/include/bsp.h
index 94764f0f7c..607e8f2454 100644
--- a/c/src/lib/libbsp/powerpc/gen5200/include/bsp.h
+++ b/c/src/lib/libbsp/powerpc/gen5200/include/bsp.h
@@ -137,17 +137,6 @@ extern rtems_configuration_table BSP_Configuration;
 */
 
 /*
- *  Define the time limits for RTEMS Test Suite test durations.
- *  Long test and short test duration limits are provided.  These
- *  values are in seconds and need to be converted to ticks for the
- *  application.
- *
- */
-
-#define MAX_LONG_TEST_DURATION       300 /* 5 minutes = 300 seconds */
-#define MAX_SHORT_TEST_DURATION      3   /* 3 seconds */
-
-/*
  *  Stuff for Time Test 27
  */
 #define MUST_WAIT_FOR_INTERRUPT 0
diff --git a/c/src/lib/libbsp/sparc/leon2/ChangeLog b/c/src/lib/libbsp/sparc/leon2/ChangeLog
index 390a336618..b2ed12d3bf 100644
--- a/c/src/lib/libbsp/sparc/leon2/ChangeLog
+++ b/c/src/lib/libbsp/sparc/leon2/ChangeLog
@@ -1,3 +1,9 @@
+2007-03-10	Joel Sherrill <joel@OARcorp.com>
+
+	PR 1227/bsps
+	* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
+	MAX_SHORT_TEST_DURATION. They are obsolete and unused.
+
 2006-12-12	Ralf Corsépius <ralf.corsepius@rtems.org>
 
 	* console/console.c, timer/timer.c: Use uint32_t instead of
diff --git a/c/src/lib/libbsp/sparc/leon2/include/bsp.h b/c/src/lib/libbsp/sparc/leon2/include/bsp.h
index 712b292415..7d344a1880 100644
--- a/c/src/lib/libbsp/sparc/leon2/include/bsp.h
+++ b/c/src/lib/libbsp/sparc/leon2/include/bsp.h
@@ -54,17 +54,6 @@ extern int rtems_smc91111_driver_attach_leon2(struct rtems_bsdnet_ifconfig *conf
 #define RTEMS_BSP_NETWORK_DRIVER_ATTACH_SMC91111 rtems_smc91111_driver_attach_leon2
 
 /*
- *  Define the time limits for RTEMS Test Suite test durations.
- *  Long test and short test duration limits are provided.  These
- *  values are in seconds and need to be converted to ticks for the
- *  application.
- *
- */
-
-#define MAX_LONG_TEST_DURATION       3   /* 3 seconds */
-#define MAX_SHORT_TEST_DURATION      3   /* 3 seconds */
-
-/*
  *  The synchronous trap is an arbitrarily chosen software trap.
  */
 
diff --git a/c/src/lib/libbsp/sparc/leon3/ChangeLog b/c/src/lib/libbsp/sparc/leon3/ChangeLog
index 496a763316..750ab7c03f 100644
--- a/c/src/lib/libbsp/sparc/leon3/ChangeLog
+++ b/c/src/lib/libbsp/sparc/leon3/ChangeLog
@@ -1,3 +1,9 @@
+2007-03-10	Joel Sherrill <joel@OARcorp.com>
+
+	PR 1227/bsps
+	* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
+	MAX_SHORT_TEST_DURATION. They are obsolete and unused.
+
 2007-02-09	Ralf Corsépius <ralf.corsepius@rtems.org>
 
 	* shmsupp/getcfg.c: Comment out npu (Unused).
diff --git a/c/src/lib/libbsp/sparc/leon3/include/bsp.h b/c/src/lib/libbsp/sparc/leon3/include/bsp.h
index e443859ec9..28f3f3ea0c 100644
--- a/c/src/lib/libbsp/sparc/leon3/include/bsp.h
+++ b/c/src/lib/libbsp/sparc/leon3/include/bsp.h
@@ -77,18 +77,6 @@ extern int rtems_leon_greth_driver_attach(
 #define RTEMS_BSP_NETWORK_DRIVER_ATTACH RTEMS_BSP_NETWORK_DRIVER_ATTACH_GRETH
 #endif
 
-
-/*
- *  Define the time limits for RTEMS Test Suite test durations.
- *  Long test and short test duration limits are provided.  These
- *  values are in seconds and need to be converted to ticks for the
- *  application.
- *
- */
-
-#define MAX_LONG_TEST_DURATION       3   /* 3 seconds */
-#define MAX_SHORT_TEST_DURATION      3   /* 3 seconds */
-
 /*
  *  Simple spin delay in microsecond units for device drivers.
  *  This is very dependent on the clock speed of the target.