From 8671786934eab0d2894809014f99c005f2c8d22a Mon Sep 17 00:00:00 2001 From: Pavel Pisa Date: Thu, 22 Sep 2016 09:50:59 +0200 Subject: arm/tms570: include hardware initialization and selftest based on Ti HalCoGen generated files. The configuration is specific for TMS570LS3137 based HDK. Pins configuration can be easily changed in rtems/c/src/lib/libbsp/arm/tms570/hwinit/init_pinmux.c file. The list tms570_selftest_par_list in the file rtems/c/src/lib/libbsp/arm/tms570/hwinit/bspstarthooks-hwinit.c specifies peripherals which health status is examined by parity self-test at BSP start-up. It can be easily modified for other TMS570 family members variants same as the selection of other tests in bspstarthooks-hwinit.c. --- .../libbsp/arm/tms570/hwinit/tms570_tcram_tests.c | 185 +++++++++++++++++++++ 1 file changed, 185 insertions(+) create mode 100644 c/src/lib/libbsp/arm/tms570/hwinit/tms570_tcram_tests.c (limited to 'c/src/lib/libbsp/arm/tms570/hwinit/tms570_tcram_tests.c') diff --git a/c/src/lib/libbsp/arm/tms570/hwinit/tms570_tcram_tests.c b/c/src/lib/libbsp/arm/tms570/hwinit/tms570_tcram_tests.c new file mode 100644 index 0000000000..d0c7bbfff5 --- /dev/null +++ b/c/src/lib/libbsp/arm/tms570/hwinit/tms570_tcram_tests.c @@ -0,0 +1,185 @@ +/** + * @file tms570_tcram_tests.c + * + * @ingroup tms570 + * + * @brief TCRAM selftest function. + */ +/* + * Copyright (c) 2016 Pavel Pisa + * + * Czech Technical University in Prague + * Zikova 1903/4 + * 166 36 Praha 6 + * Czech Republic + * + * The license and distribution terms for this file may be + * found in the file LICENSE in this distribution or at + * http://www.rtems.org/license/LICENSE. + * + * Algorithms are based on Ti manuals and Ti HalCoGen generated + * code available under following copyright. + */ +/* + * Copyright (C) 2009-2015 Texas Instruments Incorporated - www.ti.com + * + * + * Redistribution and use in source and binary forms, with or without + * modification, are permitted provided that the following conditions + * are met: + * + * Redistributions of source code must retain the above copyright + * notice, this list of conditions and the following disclaimer. + * + * Redistributions in binary form must reproduce the above copyright + * notice, this list of conditions and the following disclaimer in the + * documentation and/or other materials provided with the + * distribution. + * + * Neither the name of Texas Instruments Incorporated nor the names of + * its contributors may be used to endorse or promote products derived + * from this software without specific prior written permission. + * + * THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND CONTRIBUTORS + * "AS IS" AND ANY EXPRESS OR IMPLIED WARRANTIES, INCLUDING, BUT NOT + * LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR + * A PARTICULAR PURPOSE ARE DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT + * OWNER OR CONTRIBUTORS BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, + * SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT + * LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, + * DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY + * THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT + * (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE USE + * OF THIS SOFTWARE, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE. + * + */ + +#include +#include +#include "tms570_selftest.h" +#include "tms570_hwinit.h" + +#define tcramA1bitError (*(volatile uint32_t *)(0x08400000U)) +#define tcramA2bitError (*(volatile uint32_t *)(0x08400010U)) + +#define tcramB1bitError (*(volatile uint32_t *)(0x08400008U)) +#define tcramB2bitError (*(volatile uint32_t *)(0x08400018U)) + +#define tcramA1bit (*(volatile uint64_t *)(0x08000000U)) +#define tcramA2bit (*(volatile uint64_t *)(0x08000010U)) + +#define tcramB1bit (*(volatile uint64_t *)(0x08000008U)) +#define tcramB2bit (*(volatile uint64_t *)(0x08000018U)) + +/** + * @brief Check TCRAM ECC error detection logic (HCG:checkRAMECC) + * + * This function checks TCRAM ECC error detection and correction logic. + * The function does not return in case of TCRAM error. + * It calls bsp_selftest_fail_notification() instead. + * + */ +/* SourceId : SELFTEST_SourceId_034 */ +/* DesignId : SELFTEST_DesignId_019 */ +/* Requirements : HL_SR408 */ +void tms570_check_tcram_ecc( void ) +{ + volatile uint64_t ramread; + volatile uint32_t regread; + uint32_t tcram1ErrStat, tcram2ErrStat = 0U; + + uint64_t tcramA1_bk = tcramA1bit; + uint64_t tcramB1_bk = tcramB1bit; + uint64_t tcramA2_bk = tcramA2bit; + uint64_t tcramB2_bk = tcramB2bit; + + /* Clear RAMOCUUR before setting RAMTHRESHOLD register */ + TMS570_TCRAM1.RAMOCCUR = 0U; + TMS570_TCRAM2.RAMOCCUR = 0U; + + /* Set Single-bit Error Threshold Count as 1 */ + TMS570_TCRAM1.RAMTHRESHOLD = 1U; + TMS570_TCRAM2.RAMTHRESHOLD = 1U; + + /* Enable single bit error generation */ + TMS570_TCRAM1.RAMINTCTRL = 1U; + TMS570_TCRAM2.RAMINTCTRL = 1U; + + /* Enable writes to ECC RAM, enable ECC error response */ + TMS570_TCRAM1.RAMCTRL = 0x0005010AU; + TMS570_TCRAM2.RAMCTRL = 0x0005010AU; + + /* Force a single bit error in both the banks */ + _coreDisableRamEcc_(); + tcramA1bitError ^= 1U; + tcramB1bitError ^= 1U; + _coreEnableRamEcc_(); + + /* Read the corrupted data to generate single bit error */ + ramread = tcramA1bit; + ramread = tcramB1bit; + (void)ramread; + + /* Check for error status */ + tcram1ErrStat = TMS570_TCRAM1.RAMERRSTATUS & 0x1U; + tcram2ErrStat = TMS570_TCRAM2.RAMERRSTATUS & 0x1U; + /*SAFETYMCUSW 139 S MR:13.7 "LDRA Tool issue" */ + /*SAFETYMCUSW 139 S MR:13.7 "LDRA Tool issue" */ + if ((tcram1ErrStat == 0U) || (tcram2ErrStat == 0U)) { + /* TCRAM module does not reflect 1-bit error reported by CPU */ + bsp_selftest_fail_notification(CHECKRAMECC_FAIL1); + } else { + if (!tms570_esm_channel_sr_get(1, 26) || !tms570_esm_channel_sr_get(1, 28)) { + /* TCRAM 1-bit error not flagged in ESM */ + bsp_selftest_fail_notification(CHECKRAMECC_FAIL2); + } else { + /* Clear single bit error flag in TCRAM module */ + TMS570_TCRAM1.RAMERRSTATUS = 0x1U; + TMS570_TCRAM2.RAMERRSTATUS = 0x1U; + + /* Clear ESM status */ + tms570_esm_channel_sr_clear(1, 26); + tms570_esm_channel_sr_clear(1, 28); + } + } + +#if 0 + /* + * This test sequence requires that data abort exception + * handler checks for ECC test write enable in RAMCTR (bit 8) + * and if the access abort is intended then it should clear + * error status TCRAM status register and checks and clears + * ESM group3 uncorrectable TCRAM error channels. + * + * More modifications in BSP and RTEMS ARM support are + * required to make this code work. + */ + + /* Force a double bit error in both the banks */ + _coreDisableRamEcc_(); + tcramA2bitError ^= 3U; + tcramB2bitError ^= 3U; + _coreEnableRamEcc_(); + + /* Read the corrupted data to generate double bit error */ + ramread = tcramA2bit; + ramread = tcramB2bit; + /* read from location with 2-bit ECC error this will cause a data abort to be generated */ + /* See HalCoGen support src/sys/asm/dabort.asm */ + /* _ARMV4_Exception_data_abort_default has to include solution for this special case for RTEMS */ +#endif + + regread = TMS570_TCRAM1.RAMUERRADDR; + regread = TMS570_TCRAM2.RAMUERRADDR; + (void)regread; + + /* disable writes to ECC RAM */ + TMS570_TCRAM1.RAMCTRL = 0x0005000AU; + TMS570_TCRAM2.RAMCTRL = 0x0005000AU; + + /* Compute correct ECC */ + tcramA1bit = tcramA1_bk; + tcramB1bit = tcramB1_bk; + tcramA2bit = tcramA2_bk; + tcramB2bit = tcramB2_bk; +} -- cgit v1.2.3