From eaff189842ec8479683e9eb11959c987ec8bc43c Mon Sep 17 00:00:00 2001 From: Joel Sherrill Date: Sat, 10 Mar 2007 15:56:13 +0000 Subject: 2007-03-10 Joel Sherrill PR 1227/bsps * include/bsp.h: Remove MAX_LONG_TEST_DURATION and MAX_SHORT_TEST_DURATION. They are obsolete and unused. --- c/src/lib/libbsp/powerpc/gen5200/ChangeLog | 6 ++++++ c/src/lib/libbsp/powerpc/gen5200/include/bsp.h | 11 ----------- c/src/lib/libbsp/sparc/leon2/ChangeLog | 6 ++++++ c/src/lib/libbsp/sparc/leon2/include/bsp.h | 11 ----------- c/src/lib/libbsp/sparc/leon3/ChangeLog | 6 ++++++ c/src/lib/libbsp/sparc/leon3/include/bsp.h | 12 ------------ 6 files changed, 18 insertions(+), 34 deletions(-) diff --git a/c/src/lib/libbsp/powerpc/gen5200/ChangeLog b/c/src/lib/libbsp/powerpc/gen5200/ChangeLog index 249c722054..8dc63129d8 100644 --- a/c/src/lib/libbsp/powerpc/gen5200/ChangeLog +++ b/c/src/lib/libbsp/powerpc/gen5200/ChangeLog @@ -1,3 +1,9 @@ +2007-03-10 Joel Sherrill + + PR 1227/bsps + * include/bsp.h: Remove MAX_LONG_TEST_DURATION and + MAX_SHORT_TEST_DURATION. They are obsolete and unused. + 2007-01-24 Thomas Doerfler * console/console.c: diff --git a/c/src/lib/libbsp/powerpc/gen5200/include/bsp.h b/c/src/lib/libbsp/powerpc/gen5200/include/bsp.h index 94764f0f7c..607e8f2454 100644 --- a/c/src/lib/libbsp/powerpc/gen5200/include/bsp.h +++ b/c/src/lib/libbsp/powerpc/gen5200/include/bsp.h @@ -136,17 +136,6 @@ extern rtems_configuration_table BSP_Configuration; #define NOCACHE_MEM_SIZE 512*1024 */ -/* - * Define the time limits for RTEMS Test Suite test durations. - * Long test and short test duration limits are provided. These - * values are in seconds and need to be converted to ticks for the - * application. - * - */ - -#define MAX_LONG_TEST_DURATION 300 /* 5 minutes = 300 seconds */ -#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */ - /* * Stuff for Time Test 27 */ diff --git a/c/src/lib/libbsp/sparc/leon2/ChangeLog b/c/src/lib/libbsp/sparc/leon2/ChangeLog index 12333cd3a6..b2fdab7bbc 100644 --- a/c/src/lib/libbsp/sparc/leon2/ChangeLog +++ b/c/src/lib/libbsp/sparc/leon2/ChangeLog @@ -1,3 +1,9 @@ +2007-03-10 Joel Sherrill + + PR 1227/bsps + * include/bsp.h: Remove MAX_LONG_TEST_DURATION and + MAX_SHORT_TEST_DURATION. They are obsolete and unused. + 2006-12-02 Ralf Corsépius * configure.ac: New BUG-REPORT address. diff --git a/c/src/lib/libbsp/sparc/leon2/include/bsp.h b/c/src/lib/libbsp/sparc/leon2/include/bsp.h index 712b292415..7d344a1880 100644 --- a/c/src/lib/libbsp/sparc/leon2/include/bsp.h +++ b/c/src/lib/libbsp/sparc/leon2/include/bsp.h @@ -53,17 +53,6 @@ extern int rtems_smc91111_driver_attach_leon2(struct rtems_bsdnet_ifconfig *conf #define RTEMS_BSP_NETWORK_DRIVER_ATTACH_OPENETH rtems_leon_open_eth_driver_attach #define RTEMS_BSP_NETWORK_DRIVER_ATTACH_SMC91111 rtems_smc91111_driver_attach_leon2 -/* - * Define the time limits for RTEMS Test Suite test durations. - * Long test and short test duration limits are provided. These - * values are in seconds and need to be converted to ticks for the - * application. - * - */ - -#define MAX_LONG_TEST_DURATION 3 /* 3 seconds */ -#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */ - /* * The synchronous trap is an arbitrarily chosen software trap. */ diff --git a/c/src/lib/libbsp/sparc/leon3/ChangeLog b/c/src/lib/libbsp/sparc/leon3/ChangeLog index cd74d85e62..ab9e4f3a44 100644 --- a/c/src/lib/libbsp/sparc/leon3/ChangeLog +++ b/c/src/lib/libbsp/sparc/leon3/ChangeLog @@ -1,3 +1,9 @@ +2007-03-10 Joel Sherrill + + PR 1227/bsps + * include/bsp.h: Remove MAX_LONG_TEST_DURATION and + MAX_SHORT_TEST_DURATION. They are obsolete and unused. + 2007-02-06 Ralf Corsépius * shmsupp/getcfg.c: Replace rtems_unsigned32 with uint32_t. diff --git a/c/src/lib/libbsp/sparc/leon3/include/bsp.h b/c/src/lib/libbsp/sparc/leon3/include/bsp.h index e443859ec9..28f3f3ea0c 100644 --- a/c/src/lib/libbsp/sparc/leon3/include/bsp.h +++ b/c/src/lib/libbsp/sparc/leon3/include/bsp.h @@ -77,18 +77,6 @@ extern int rtems_leon_greth_driver_attach( #define RTEMS_BSP_NETWORK_DRIVER_ATTACH RTEMS_BSP_NETWORK_DRIVER_ATTACH_GRETH #endif - -/* - * Define the time limits for RTEMS Test Suite test durations. - * Long test and short test duration limits are provided. These - * values are in seconds and need to be converted to ticks for the - * application. - * - */ - -#define MAX_LONG_TEST_DURATION 3 /* 3 seconds */ -#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */ - /* * Simple spin delay in microsecond units for device drivers. * This is very dependent on the clock speed of the target. -- cgit v1.2.3