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-rw-r--r--c/src/lib/libbsp/sparc/leon3/include/bsp.h12
1 files changed, 0 insertions, 12 deletions
diff --git a/c/src/lib/libbsp/sparc/leon3/include/bsp.h b/c/src/lib/libbsp/sparc/leon3/include/bsp.h
index e443859ec9..28f3f3ea0c 100644
--- a/c/src/lib/libbsp/sparc/leon3/include/bsp.h
+++ b/c/src/lib/libbsp/sparc/leon3/include/bsp.h
@@ -77,18 +77,6 @@ extern int rtems_leon_greth_driver_attach(
#define RTEMS_BSP_NETWORK_DRIVER_ATTACH RTEMS_BSP_NETWORK_DRIVER_ATTACH_GRETH
#endif
-
-/*
- * Define the time limits for RTEMS Test Suite test durations.
- * Long test and short test duration limits are provided. These
- * values are in seconds and need to be converted to ticks for the
- * application.
- *
- */
-
-#define MAX_LONG_TEST_DURATION 3 /* 3 seconds */
-#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
-
/*
* Simple spin delay in microsecond units for device drivers.
* This is very dependent on the clock speed of the target.