2007-03-10 Joel Sherrill <joel@OARcorp.com>

	PR 1227/bsps
	* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
	MAX_SHORT_TEST_DURATION. They are obsolete and unused.

6 files changed, 18 insertions, 34 deletions

diff --git a/c/src/lib/libbsp/powerpc/gen5200/ChangeLog b/c/src/lib/libbsp/powerpc/gen5200/ChangeLog
index 249c722054..8dc63129d8 100644
--- a/c/src/lib/libbsp/powerpc/gen5200/ChangeLog
+++ b/c/src/lib/libbsp/powerpc/gen5200/ChangeLog
@@ -1,3 +1,9 @@
+2007-03-10	Joel Sherrill <joel@OARcorp.com>
+
+	PR 1227/bsps
+	* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
+	MAX_SHORT_TEST_DURATION. They are obsolete and unused.
+
 2007-01-24      Thomas Doerfler <Thomas.Doerfler@embedded-brains.de>
 
 	* console/console.c:
diff --git a/c/src/lib/libbsp/powerpc/gen5200/include/bsp.h b/c/src/lib/libbsp/powerpc/gen5200/include/bsp.h
index 94764f0f7c..607e8f2454 100644
--- a/c/src/lib/libbsp/powerpc/gen5200/include/bsp.h
+++ b/c/src/lib/libbsp/powerpc/gen5200/include/bsp.h
@@ -137,17 +137,6 @@ extern rtems_configuration_table BSP_Configuration;
 */
 
 /*
- *  Define the time limits for RTEMS Test Suite test durations.
- *  Long test and short test duration limits are provided.  These
- *  values are in seconds and need to be converted to ticks for the
- *  application.
- *
- */
-
-#define MAX_LONG_TEST_DURATION       300 /* 5 minutes = 300 seconds */
-#define MAX_SHORT_TEST_DURATION      3   /* 3 seconds */
-
-/*
  *  Stuff for Time Test 27
  */
 #define MUST_WAIT_FOR_INTERRUPT 0
diff --git a/c/src/lib/libbsp/sparc/leon2/ChangeLog b/c/src/lib/libbsp/sparc/leon2/ChangeLog
index 12333cd3a6..b2fdab7bbc 100644
--- a/c/src/lib/libbsp/sparc/leon2/ChangeLog
+++ b/c/src/lib/libbsp/sparc/leon2/ChangeLog
@@ -1,3 +1,9 @@
+2007-03-10	Joel Sherrill <joel@OARcorp.com>
+
+	PR 1227/bsps
+	* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
+	MAX_SHORT_TEST_DURATION. They are obsolete and unused.
+
 2006-12-02	Ralf Corsépius <ralf.corsepius@rtems.org>
 
 	* configure.ac: New BUG-REPORT address.
diff --git a/c/src/lib/libbsp/sparc/leon2/include/bsp.h b/c/src/lib/libbsp/sparc/leon2/include/bsp.h
index 712b292415..7d344a1880 100644
--- a/c/src/lib/libbsp/sparc/leon2/include/bsp.h
+++ b/c/src/lib/libbsp/sparc/leon2/include/bsp.h
@@ -54,17 +54,6 @@ extern int rtems_smc91111_driver_attach_leon2(struct rtems_bsdnet_ifconfig *conf
 #define RTEMS_BSP_NETWORK_DRIVER_ATTACH_SMC91111 rtems_smc91111_driver_attach_leon2
 
 /*
- *  Define the time limits for RTEMS Test Suite test durations.
- *  Long test and short test duration limits are provided.  These
- *  values are in seconds and need to be converted to ticks for the
- *  application.
- *
- */
-
-#define MAX_LONG_TEST_DURATION       3   /* 3 seconds */
-#define MAX_SHORT_TEST_DURATION      3   /* 3 seconds */
-
-/*
  *  The synchronous trap is an arbitrarily chosen software trap.
  */
 
diff --git a/c/src/lib/libbsp/sparc/leon3/ChangeLog b/c/src/lib/libbsp/sparc/leon3/ChangeLog
index cd74d85e62..ab9e4f3a44 100644
--- a/c/src/lib/libbsp/sparc/leon3/ChangeLog
+++ b/c/src/lib/libbsp/sparc/leon3/ChangeLog
@@ -1,3 +1,9 @@
+2007-03-10	Joel Sherrill <joel@OARcorp.com>
+
+	PR 1227/bsps
+	* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
+	MAX_SHORT_TEST_DURATION. They are obsolete and unused.
+
 2007-02-06	Ralf Corsépius <ralf.corsepius@rtems.org>
 
 	* shmsupp/getcfg.c: Replace rtems_unsigned32 with uint32_t.
diff --git a/c/src/lib/libbsp/sparc/leon3/include/bsp.h b/c/src/lib/libbsp/sparc/leon3/include/bsp.h
index e443859ec9..28f3f3ea0c 100644
--- a/c/src/lib/libbsp/sparc/leon3/include/bsp.h
+++ b/c/src/lib/libbsp/sparc/leon3/include/bsp.h
@@ -77,18 +77,6 @@ extern int rtems_leon_greth_driver_attach(
 #define RTEMS_BSP_NETWORK_DRIVER_ATTACH RTEMS_BSP_NETWORK_DRIVER_ATTACH_GRETH
 #endif
 
-
-/*
- *  Define the time limits for RTEMS Test Suite test durations.
- *  Long test and short test duration limits are provided.  These
- *  values are in seconds and need to be converted to ticks for the
- *  application.
- *
- */
-
-#define MAX_LONG_TEST_DURATION       3   /* 3 seconds */
-#define MAX_SHORT_TEST_DURATION      3   /* 3 seconds */
-
 /*
  *  Simple spin delay in microsecond units for device drivers.
  *  This is very dependent on the clock speed of the target.